Jose Pineda De Gyvez

Integrated Circuit Defect-Sensitivity: Theory And Computational Models

Low-Power High-Resolution Analog To Digital Converters

Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits

Defect-Oriented Testing For Nano-Metric Cmos Vlsi Circuits

Low-Power High-Resolution Analog To Digital Converters

Integrated Circuit Defect-Sensitivity: Theory And Computational Models