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3D IC Integration and Packaging - Lau, John H.

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        Présentation 3d Ic Integration And Packaging de Lau, John H. Format Relié

         - Livre Encyclopédies, Dictionnaires

        Livre Encyclopédies, Dictionnaires - Lau, John H. - 01/08/2015 - Relié - Langue : Anglais

        . .

      • Auteur(s) : Lau, John H.
      • Editeur : Mcgraw-Hill Education
      • Langue : Anglais
      • Parution : 01/08/2015
      • Format : Moyen, de 350g à 1kg
      • Nombre de pages : 482.0
      • Expédition : 1011
      • Dimensions : 24.1 x 19.1 x 3.0
      • ISBN : 0071848061



      • Résumé :
        A comprehensive guide to 3D IC integration and packaging technology 3D IC Integration and Packaging fully explains the latest microelectronics techniques for increasing chip density and maximizing performance while reducing power consumption. Based on a course developed by its author, this practical guide offers real-world problem-solving methods and teaches the trade-offs inherent in making system-level decisions. Explore key enabling technologies such as TSV, thin-wafer strength measurement and handling, microsolder bumping, redistribution layers, interposers, wafer-to-wafer bonding, chip-to-wafer bonding, 3D IC and MEMS, LED, and complementary metal-oxide semiconductor image sensors integration. Assembly, thermal management, and reliability are covered in complete detail. 3D IC Integration and Packaging covers: ? 3D integration for semiconductor IC packaging? Through-silicon vias modeling and testing? Stress sensors for thin-wafer handling and strength measurement? Package substrate technologies? Microbump fabrication, assembly, and reliability? 3D Si integration? 2.5D/3D IC integration? 3D IC integration with passive interposer? Thermal management of 2.5D/3D IC integration? Embedded 3D hybrid integration? 3D LED and IC integration? 3D MEMS and IC integration? 3D CMOS image sensors and IC integration? PoP, chip-to-chip interconnects, and embedded fan-out WLP...

        Biographie:
        John H. Lau received his Ph.D. degree in Theoretical and Applied Mechanics from the University of Illinois (1977), a M.A.Sc. degree in Structural Engineering from the University of British Columbia (1973), a second M.S. degree in Engineering Physics from the University of Wisconsin (1974), and a third M.S. degree in Management Science from Fairleigh Dickinson University (1981). He also has a B.E. degree in Civil Engineering from National Taiwan University (1970). John is an interconnection technology scientist at Agilent Technologies, Inc. His current interests cover a broad range of electronic and optoelectronic packaging and manufacturing technology. Prior to Agilent, he worked for Express Packaging Systems, Hewlett-Packard Company, Sandia National Laboratory, Bechtel Power Corporation, and Exxon Production and Research Company. With more than 30 years of R&D and manufacturing experience in the electronics, petroleum, nuclear, and defense industries, he has given over 200 workshops, authored and co-authored over 180 peer reviewed technical publications, and is the author and editor of 13 books: Solder Joint Reliability...

        Sommaire:

        Publisher's Note: Products purchased from Third Party sellers are not guaranteed by the publisher for quality, authenticity, or access to any online entitlements included with the product.




        A comprehensive guide to 3D IC integration and packaging technology
        >3D IC Integration and Packaging fully explains the latest microelectronics techniques for increasing chip density and maximizing performance while reducing power consumption. Based on a course developed by its author, this practical guide offers real-world problem-solving methods and teaches the trade-offs inherent in making system-level decisions. Explore key enabling technologies such as TSV, thin-wafer strength measurement and handling, microsolder bumping, redistribution layers, interposers, wafer-to-wafer bonding, chip-to-wafer bonding, 3D IC and MEMS, LED, and complementary metal-oxide semiconductor image sensors integration. Assembly, thermal management, and reliability are covered in complete detail.

        >3D IC Integration and Packaging covers:

        >? 3D integration for semiconductor IC packaging
        ? Through-silicon vias modeling and testing
        ? Stress sensors for thin-wafer handling and strength measurement
        ? Package substrate technologies
        ? Microbump fabrication, assembly, and reliability
        ? 3D Si integration
        ? 2.5D/3D IC integration
        ? 3D IC integration with passive interposer
        ? Thermal management of 2.5D/3D IC integration
        ? Embedded 3D hybrid integration
        ? 3D LED and IC integration
        ? 3D MEMS and IC integration
        ? 3D CMOS image sensors and IC integration
        ? PoP, chip-to-chip interconnects, and embedded fan-out WLP
        ...

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