Soft Error Reliability of VLSI Circuits - Raji, Mohsen
- Format: Relié Voir le descriptif
Vous en avez un à vendre ?
Vendez-le-vôtre70,91 €
Produit Neuf
Ou 17,73 € /mois
- Livraison à 0,01 €
- Livré entre le 4 et le 11 mai
Brand new, In English, Fast shipping from London, UK; Tout neuf, en anglais, expédition rapide depuis Londres, Royaume-Uni;ria9783030516093_dbm
- Payez directement sur Rakuten (CB, PayPal, 4xCB...)
- Récupérez le produit directement chez le vendeur
- Rakuten vous rembourse en cas de problème
Gratuit et sans engagement
Félicitations !
Nous sommes heureux de vous compter parmi nos membres du Club Rakuten !
TROUVER UN MAGASIN
Retour
Avis sur Soft Error Reliability Of Vlsi Circuits Format Relié - Livre Littérature Générale
0 avis sur Soft Error Reliability Of Vlsi Circuits Format Relié - Livre Littérature Générale
Les avis publiés font l'objet d'un contrôle automatisé de Rakuten.
-
Encyclopedia Of Hydrangeas
Occasion dès 51,25 €
-
World Radio Tv Handbook 2024: The Directory Of Global Broadcasting
Neuf dès 53,48 €
Occasion dès 39,54 €
-
The Oxford Companion To Jazz
Neuf dès 171,99 €
Occasion dès 38,06 €
-
Stone Age - Ancient Castles Of Europe
1 avis
Occasion dès 102,40 €
-
Dragon Quest 8 - Guide Stratégique Officiel
23 avis
Occasion dès 40,95 €
-
Woman In The Mirror
Occasion dès 44,00 €
-
Marzipan
Occasion dès 43,59 €
-
Das Lyrische Werk
Neuf dès 123,20 €
Occasion dès 77,30 €
-
Mark Morrisroe
Neuf dès 55,86 €
Occasion dès 42,45 €
-
Robert Polidori: After The Flood
2 avis
Occasion dès 68,00 €
-
This Is Service Design Doing
Occasion dès 36,56 €
-
77 Secrets De Mécaniciens
Occasion dès 41,96 €
-
Robert Longo
Neuf dès 66,12 €
Occasion dès 44,29 €
-
Geometric Measure Theory
Occasion dès 47,47 €
-
Greek New Testament Gnt6. Standardausgabe
Neuf dès 79,68 €
Occasion dès 39,06 €
-
The Golden Cage The Enigma Of Anorexia Nervosa
Occasion dès 47,59 €
-
Stand Der Dinge
Occasion dès 48,00 €
-
Bikablo Émotions
1 avis
Occasion dès 42,85 €
-
Ossi Di Seppia (Italian Edition)
Occasion dès 38,77 €
-
The Wes Anderson Collection
2 avis
Occasion dès 35,99 €
Produits similaires
Présentation Soft Error Reliability Of Vlsi Circuits Format Relié
- Livre Littérature Générale
Résumé :
This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of today?s reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electronic systems. The emphasis is on modeling approaches and algorithms for analysis and mitigation of soft errors in nano-scale CMOS digital circuits, using techniques that are the cornerstone of Computer Aided Design (CAD) of reliable VLSI circuits. The authors introduce software tools for analysis and mitigation of soft errors in electronic systems, which can be integrated easily with design flows. In addition to discussing soft error aware analysis techniques for combinational logic, the authors also describe new soft error mitigation strategies targeting commercial digital circuits. Coverage includes novel Soft Error Rate (SER) analysis techniques such as process variation aware SER estimation and GPU accelerated SER analysis techniques, in addition to SER reduction methods such as gate sizing and logic restructuring based SER techniques.
Biographie:
Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently Tenured Associate Professor. He teaches courses in design of digital systems, computer architecture, FPGA design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, robust logic designs, and FPGA-based design. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA systems in industry. Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran,Iran. He has been serving as an Assistant Professor in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems....
Sommaire: Introduction: Soft Error Modeling.- Soft Error Rate Estimation of VLSI circuits.- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits.- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits.- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits.- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing.- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.
Détails de conformité du produit
Personne responsable dans l'UE