X-Ray and Neutron Reflectivity: Principles and Applications - Jean Daillant
- Format: Broché
- 356 pages Voir le descriptif
Vous en avez un à vendre ?
Vendez-le-vôtre66,66 €
Occasion · Comme Neuf
Ou 16,67 € /mois
- Livraison GRATUITE
- Livré entre le 22 et le 27 juin
- Protection acheteurs :
- 2,99 €
Neuf, en anglais, exp?dition rapide depuis Londres, Royaume-Uni; New, In English, Fast shipping from London, UK;ria9783662142509_lsuk
Nos autres offres
-
83,32 €
Produit Neuf
Ou 20,83 € /mois
- Livraison à 0,01 €
- Livré entre le 1 et le 3 juillet
-
106,23 €
Produit Neuf
Ou 26,56 € /mois
- Livraison à 0,01 €
- Livré entre le 27 juin et le 2 juillet
- Payez directement sur Rakuten (CB, PayPal, 4xCB...)
- Récupérez le produit directement chez le vendeur
- Rakuten vous rembourse en cas de problème
Gratuit et sans engagement
Félicitations !
Nous sommes heureux de vous compter parmi nos membres du Club Rakuten !
TROUVER UN MAGASIN
Retour
![](https://fr.shopping.rakuten.com/rakuten-static-deliver/app/679.3.0/20211029/static/front/brand/www/images/default/structure/blank.gif)
Avis sur X - Ray And Neutron Reflectivity: Principles And Applications de Alain Gibaud Format Broché - Livre
0 avis sur X - Ray And Neutron Reflectivity: Principles And Applications de Alain Gibaud Format Broché - Livre
Donnez votre avis et cumulez 5
Les avis publiés font l'objet d'un contrôle automatisé de Rakuten.
Présentation X - Ray And Neutron Reflectivity: Principles And Applications de Alain Gibaud Format Broché
- Livre- Auteur(s) : Jean Daillant - Alain Gibaud
- Editeur : Springer Berlin
- Langue : Anglais
- Parution : 01/08/2014
- Nombre de pages : 356
- Expédition : 540
- Dimensions : 23.5 x 15.5 x 2.0
Résumé :
The reflection of and neutrons from surfaces has existed as an x-rays exp- imental for almost it is in the last technique fifty Nevertheless, only years. decade that these methods have become as of enormously popular probes This the surfaces and interfaces. to be due to of several appears convergence of intense different circumstances. These include the more n- availability be measured orders tron and sources that can over (so reflectivity x-ray many of and the much weaker surface diffuse can now also be magnitude scattering of thin films and studied in some the detail); growing importance multil- basic the realization of the ers in both and technology research; important which in the of surfaces and and role roughness plays properties interfaces; the of statistical models to characterize the of finally development topology its and its characterization from on roughness, dependence growth processes The of and to surface scattering experiments. ability x-rays neutro4s study four five orders of in scale of surfaces over to magnitude length regardless their and also their to ability probe environment, temperature, pressure, etc. , makes these the choice for buried interfaces often probes preferred obtaining information about the microstructure of often in statistical a global surfaces, the local This is manner to complementary imaging microscopy techniques, of such studies in the literature witnessed the veritable by explosion published the last few Thus these lectures will useful for over a resource years.
Sommaire:
Principles.- The Interaction of X-rays (and Neutrons) with Matter.- Statistical Aspects of Wave Scattering at Rough Surfaces.- Specular Reflectivity from Smooth and Rough Surfaces.- Diffuse Scattering.- Neutron Reflectometry.- Applications.- Statistical Physics at Crystal Surfaces.- Experiments on Solid Surfaces.- X-ray Reflectivity by Rough Multilayers.- Reflectivity of Liquid Surfaces and Interfaces.- polymer Studies.