Next Generation Halt and Hass - Gray, Kirk A

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Résumé :

Series Editor's Foreword xi

Preface xiv

List of Acronyms xvi

Introduction 1

1 Basis and Limitations of Typical Current Reliability Methods and Metrics 5

1.1 The Life Cycle Bathtub Curve 7

1.1.1 Real Electronics Life Cycle Curves 9

1.2 HALT and HASS Approach 11

1.3 The Future of Electronics: Higher Density and Speed and Lower Power 13

1.3.1 There is a Drain in the Bathtub Curve 14

1.4 Use of MTBF as a Reliability Metric 16

1.5 MTBF: What is it Good For? 17

1.5.1 Introduction 17

1.5.2 Examples 18

1.5.3 Conclusion 24

1.5.4 Alternatives to MTBF for Specifying Reliability 25

1.6 Reliability of Systems is Complex 26

1.7 Reliability Testing 28

1.8 Traditional Reliability Development 33

Bibliography 34

2 The Need for Reliability Assurance Reference Metrics to Change 36

2.1 Wear?Out and Technology Obsolescence of Electronics 36

2.2 Semiconductor Life Limiting Mechanisms 37

2.2.1 Overly Optimistic and Misleading Estimates 42

2.3 Lack of Root Cause Field Unreliability Data 43

2.4 Predicting Reliability 48

2.5 Reliability Predictions - Continued Reliance on a Misleading Approach 50

2.5.1 Introduction 51

2.5.2 Prediction History 52

2.5.3 Technical Limitations 53

2.5.4 Keeping Handbooks Up?t?Date 54

2.5.5 Technical Studies - Past and Present 59

2.5.6 Reliability Assessment 62

2.5.7 Efforts to Improve Tools and Their Limitations 63

2.6 Stress-Strength Diagram and Electronics Capability 63

2.7 Testing to Discover Reliability Risks 68

2.8 Stress-Strength Normal Assumption 69

2.8.1 Notation 70

2.8.2 Three Cases 71

2.8.3 Two Normal Distributions 73

2.8.4 Probability of Failure Calculation 73

2.9 A Major Challenge - Distributions Data 73

2.10 HALT Maximizes the Design's Mean Strength 75

2.11 What Does the Term HALT Actually Mean? 78

Bibliography 83

3 Challenges to Advancing Electronics Reliability Engineering 86

3.1 Disclosure of Real Failure Data is Rare 86

3.2 Electronics Materials and Manufacturing Evolution 89

Bibliography 91

4 A New Deterministic Reliability Development Paradigm 92

4.1 Introduction 92

4.2 Understanding Customer Needs and Expectations 95

4.3 Anticipating Risks and Potential Failure Modes 98

4.4 Robust Design for Reliability 104

4.5 Diagnostic and Prognostic Considerations and Features 110

4.6 Knowledge Capture for Reuse 110

4.7 Accelerated Test to Failure to Find Empirical Design Limits 112

4.8 Design Confirmation Testing: Quantitative Accelerated Life Test 113

4.9 Limitations of Success Based Compliance Test 114

4.10 Production Validation Testing 115

4.11 Failure Analysis and Design Review Based on Test Results 116

Bibliography 120

5 Common Understanding of HALT Approach is Critical for Success 122

5.1 HALT - Now a Very Common Term 123

5.2 HALT - Change from Failure Prediction to Failure Discovery 124

5.2.1 Education on the HALT Paradigm 125

5.3 Serial Education of HALT May Increase Fear, Uncertainty and Doubt 130

5.3.1 While You Were Busy in the Lab 132

5.3.2 Product Launch Time - Too Late, But Now You May Get the Field Failure Data 132

6 The Fundamentals of HALT 134

6.1 Discovering System Stress Limits 134

6.2 HALT is a Simple Concept - Adaptation is the Challenge 135

6.3 Cost of Reliable vs Unreliable Design 136

6.4 HALT Stress Limits and Estimates of Failure Rates 137

6.4....

Biographie:

Kirk A. Gray, Accelerated Reliability Solutions, LLC, Colorado, USA.

John J. Paschkewitz, Product Assurance Engineering, LLC, Missouri, USA.