Developments in Applied Spectroscopy - Alfred J Perkins

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Sommaire:
Dispersive and Nondispersive X-Ray Fluorescence Methods for the Measurement of the Thicknesses of Films of Cadmium Sulfide and Other II-VI Compounds.- Applications of X-Ray Topography in the Characterization of Semiconductor Surface Layers.- High-Energy Electron-Diffraction and X-Ray Emission Analysis of Surfaces and Their Reaction Products.- Surface Analysis with the Electron Probe.- Experience with a Computer-Coupled X-Ray Spectrometer.- Use of Total Reflection at the Critical Angle for Dispersion of Ultrasoft X-Rays.- The Shift in Wavelength with Voltage of Certain X-Ray Lines.- Spectroscopy Study of Hot Gases.- Analysis of Plant-Ash Solutions by Spark-Emission Spectroscopy.- Routine Industrial Analysis of Stainless Steels.- Some Difficult Working Areas in Atomic-Absorption Flame Photometry.- A New Look at Calcium Flame Interferences.- Some Experimental Considerations in Atomic Absorption.- An Experimental Device for Atomic-Absorption Spectroscopy.- Indirect Atomic-Absorption Spectrometric Methods of Analysis.- Atomic-Absorption Spectrophotometry in Mineral and Trace-Element Studies in Man.- Investigation of Solids by Means of an Ion-Bombardment Mass Spectrometer.- Application of Mass Spectrometry to Forensic Toxicology. I. Acidic and Neutral Drugs.- Identification and Determination of Oxidation Inhibitors in Synthetic Lube Oils by Ultraviolet and Mass Spectrometry.- Spectroscopy in Space-An Introduction and Overview.- A Computer-Controlled System for Automatically Scanning and Interpreting Photographic Spectra.- Nuclear Applications of Liquid Scintillation Systems.- A Comparison of the Function of the Slit in Light-Absorption Studies Using Tungsten and Laser Sources.