Electrical Degradation and Breakdown in Polymers - J. C. Fothergill

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Auteur(s) : J. C. Fothergill - L. A. Dissado

Editeur : Institution Of Engineering & Technology

Langue : Anglais

Parution : 01/06/1992

Format : Moyen, de 350g à 1kg

Nombre de pages : 620

Expédition : 1094

Dimensions : 24.0 x 16.1 x 3.7

ISBN : 0863411967

Résumé :

The book is in five parts: Part 1: Introduction to polymers and electrical breakdown. Part 2: Treeing degradation in polymers. Part 3: Deterministic mechanisms of breakdowns. Part 4: The stochastic nature of breakdown. Part 5: Engineering considerations for breakdown testing and degradation assessment.

Biographie:

Len Dissado studied chemistry at University College London, obtaining a First Class degree in 1963 and a PhD in 1966. He subsequently developed the theory of excitons and exciton-phonon interactions in molecular crystals at the Research School of Chemistry, ANU, Canberra, Australia. Since 1977, when he joined the Department of Physics at Chelsea College, University of London, his major interest has centred on the topic of dielectrics. When he became a consultant to Standard Telecommunications Laboratories (STL) in 1981, his interests expanded to cover the field of dielectric breakdown. He has published over 100 scientific papers on a wide range of topics and was awarded the degree of DSc in 1990 by the University of London.

Sommaire:

• Part 1: Introduction to polymers and electrical breakdown
• Chapter 1: Polymer structure and morphology
• Chapter 2: Polymers as wide band-gap insulators
• Chapter 3: Overview of electrical degradation and breakdown
• Part 2: Treeing degradation in polymers
• Chapter 4: Water treeing degradation
• Chapter 5: Electrical tree degradation
• Chapter 6: Tree-initiated breakdown
• Chapter 7: Factors affecting treeing
• Chapter 8: Routes to tree inhibition
• Part 3: Deterministic mechanisms of breakdowns
• Chapter 9: Charge injection and transport in insulating polymers
• Chapter 10: Thermal breakdown
• Chapter 11: Electromechanical breakdown
• Chapter 12: Electronic breakdown
• Chapter 13: Partial discharge and free volume breakdown
• Part 4: The stochastic nature of breakdown
• Chapter 14: Statistical features of breakdown
• Chapter 15: Stochastic models of breakdown
• Part 5: Engineering considerations for breakdown testing and degradation assessment
• Chapter 16: Breakdown testing and analysis
• Chapter 17: Comparison of AC and DC breakdown behaviour
• Chapter 18: Cable assessment procedures
• Chapter 19: Detecting electrical degradation non-destructively
• Appendix 1: Computer program for calculating Weibull parameters
• Appendix 2: Calculating the Threshold value of a 3-parameter Weibull Distribution using MATHCAD⁸²⁶
• Appendix 3: Mathematical proof