Measuring Shape - Neal, F. Brent
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Présentation Measuring Shape Format Relié
- Livre Encyclopédies, Dictionnaires
Résumé : Clear, accessible, and well-organized, this book provides a one-stop resource on the various techniques of 2- and 3D shape description and measurement. It presents consistent and coherent summaries of the various methods so that engineers, researchers, and others can compare methods, select the one appropriate for their specific task, and gain enough detailed information about them to implement and test them. It includes practical application such as relating fractal dimension of nuclear membranes in cells to disease, or relating harmonic analysis to weathering of sediments, or classifying the genetics of squash seeds by dimensionless ratios.
Biographie:
Brent Neal is a scientist and industrial researcher with Milliken & Company, where he currently leads the central materials characterization and analytical chemistry facility. In this role, he leads efforts in technology and product development through deep understanding of materials performance. He has three patents issued or pending based on his work in polymer-matrix composites. Prior to his tenure at Milliken & Company, he consulted and developed bespoke software for quantitative image analysis. He received his Ph.D. in solid state physics from Louisiana State University in 2002. Over the course of his career, he has measured and analyzed images from many different fields and his experience in materials characterization and measurement has been applied everywhere from the lab bench to manufacturing plants. In his 50-year career as scientist and educator, John Russ has used image processing and analysis as a principal tool for understanding and characterizing the structure and function of materials. Much of Russ' research work has been concerned with the microstructure and surface topography of metals and ceramics. He has received funding for his research from government agencies and from industry. Teaching the principles and methods involved to several thousand students-in addition to consulting for many industrial clients-has further broadened Dr. Russ' experience and the scope of applications for image processing and analysis. He continues to write and consult for a variety of companies (and to provide expert testimony in criminal and civil cases). He also still teaches image processing and analysis workshops worldwide and reviews publications and funding proposals.
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