Principles of Electron Optics, Volume 2 -

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Auteur(s) : Collectif

Editeur : Elsevier Science Publishing Co Inc

Langue : Anglais

Parution : 01/12/2017

Format : Moyen, de 350g à 1kg

Nombre de pages : 766

Expédition : 1535

Dimensions : 23.5 x 19.5 x 4.7

ISBN : 0128133694

Résumé :

Principles of Electron Optics: Applied Geometrical Optics, Second Edition gives detailed information about the many optical elements that use the theory presented in Volume 1: electrostatic and magnetic lenses, quadrupoles, cathode-lens-based instruments including the new ultrafast microscopes, low-energy-electron microscopes and photoemission electron microscopes and the mirrors found in their systems, Wien filters and deflectors. The chapter on aberration correction is largely new. The long section on electron guns describes recent theories and covers multi-column systems and carbon nanotube emitters. Monochromators are included in the section on curved-axis systems.

The lists of references include many articles that will enable the reader to go deeper into the subjects discussed in the text.

The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

Biographie:
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Sommaire:

PART VII - INSTRUMENTAL OPTICS 35. Electrostatic Lenses? 36. Magnetic Lenses? 37. Electron Mirrors, Low-energy-electron Microscopes and Photoemission Electron Microscopes, Cathode Lenses and Field-emisssion Microscopy? 38. The Wien Filter? 39. Quadrupole Lenses? 40. Deflection Systems?

PART VIII - ABERRATION CORRECTION AND BEAM INTENSITY DISTRIBUTION (CAUSTICS) 41. Aberration Correction? 42. Caustics and their Applications?

PART IX - ELECTRON GUNS 43. General Features of Electron Guns? 44. Theory of Electron Emission? 45. Pointed Cathodes without Space Charge? 46. Space Charge Effects? 47. Brightness? 48. Emittance? 49. Gun optics? 50. Complete Electron Guns?

PART X - SYSTEMS WITH A CURVED OPTIC AXIS 51. General Curvilinear Systems? 52. Magnetic Sector Fields? 53. Unified Theories of Ion Optical Systems