Materials Characterization 2e - Leng

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Résumé :
Now in its second edition, this continues to serve as an ideal textbook for introductory courses on materials characterization, based on the author's experience in teaching advanced undergraduate and postgraduate university students. The new edition retains the successful didactical concept of introductions at the beginning of chapters, exercise questions and an online solution manual. In addition, all the sections have been thoroughly revised, updated and expanded, with two major new topics (electron backscattering diffraction and environmental scanning electron microscopy), as well as fifty additional questions - in total about 20% new content. The first part covers commonly used methods for microstructure analysis, including light microscopy, X-ray diffraction, transmission and scanning electron microscopy, as well as scanning probe microscopy. The second part of the book is concerned with techniques for chemical analysis and introduces X-ray energy dispersive spectroscopy, fluorescence X-ray spectroscopy and such popular surface analysis techniques as photoelectron and secondary ion mass spectroscopy. This section concludes with the two most important vibrational spectroscopies (infra-red and Raman) and the increasingly important thermal analysis. The theoretical concepts are discussed with a minimal involvement of mathematics and physics, and the technical aspects are presented with the actual measurement practice in mind. Making for an easy-to-read text, the book never loses sight of its intended audience.

Biographie:
Yang Leng is Professor, specialized in materials science and engineering, at The Hong Kong University of Science and Technology (HKUST). His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has extensively published in international journals. In addition, he has actively engaged in industrial consultancy. His contribution to teaching materials science and engineering is exemplified by the Teaching Excellence Appreciation award from the HKUST.

Sommaire:
LIGHT MICROSCOPY Optical Principles Instrumentation Specimen Preparation Imaging Modes Confocal Microscopy Questions X-RAY DIFFRACTION METHODS X-ray Radiation Theoretical Background of Diffraction X-ray Diffractometry Wide Angle X-ray Diffraction and Scattering TRANSMISSION ELECTRON MICROSCOPY Image Modes Selected Area Diffraction Images of Crystal Defects SCANNING ELECTRON MICROSCOPY Contrast Formation Operational Variables SCANNING PROBE MICROSCOPY Scanning Tunneling Microscopy Atomic Force Microscopy Image Artifacts X-RAY SPECTROSCOPY FOR ELEMENTAL ANALYSIS Features of Characteristic X-rays X-ray Fluorescence Spectrometry Energy Dispersive Spectroscopy in Electron Microscopes Qualitative and Quantitative Analysis ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS Basic Principles Characteristics of Electron Spectra SECONDARY ION MASS SPECTROMETRY FOR SURFACE ANALYSIS Surface Structure Analysis SIMS Imaging SIMS Depth Profiling VIBRATIONAL SPECTROSCOPY FOR MOLECULAR ANALYSIS Theoretical Background Fourier Transform Infrared Spectroscopy Raman Microscopy Interpretation of Vibrational Spectra THERMAL ANALYSIS Common Characteristics Differential Thermal Analysis and Differential Scanning Calorimetry Thermogravimetry