Personnaliser

OK

Next Generation and Advanced Network Reliability Analysis - Ali, Syed Riffat

Note : 0

0 avis
  • Soyez le premier à donner un avis

Vous en avez un à vendre ?

Vendez-le-vôtre

Prix conseillé  173,99 €

-5%

Qu'est-ce que le prix barré ?

C'est le prix de vente conseillé par le fabricant ou l'importateur du produit.

En savoir plus

164,79 €

Produit Neuf

  • Ou 41,20 € /mois

    • Livraison à 0,01 €
    • Livré entre le 6 et le 13 mai
    Voir les modes de livraison

    RiaChristie

    PRO Vendeur favori

    4,9/5 sur + de 1 000 ventes

    Brand new, In English, Fast shipping from London, UK; Tout neuf, en anglais, expédition rapide depuis Londres, Royaume-Uni;ria9783030016463_dbm

    Publicité
     
    Vous avez choisi le retrait chez le vendeur à
    • Payez directement sur Rakuten (CB, PayPal, 4xCB...)
    • Récupérez le produit directement chez le vendeur
    • Rakuten vous rembourse en cas de problème

    Gratuit et sans engagement

    Félicitations !

    Nous sommes heureux de vous compter parmi nos membres du Club Rakuten !

    En savoir plus

    Retour

    Horaires

        Note :


        Avis sur Next Generation And Advanced Network Reliability Analysis de Ali, Syed Riffat Format Relié  - Livre Technologie

        Note : 0 0 avis sur Next Generation And Advanced Network Reliability Analysis de Ali, Syed Riffat Format Relié  - Livre Technologie

        Les avis publiés font l'objet d'un contrôle automatisé de Rakuten.


        Présentation Next Generation And Advanced Network Reliability Analysis de Ali, Syed Riffat Format Relié

         - Livre Technologie

        Livre Technologie - Ali, Syed Riffat - 01/11/2018 - Relié - Langue : Anglais

        . .

      • Auteur(s) : Ali, Syed Riffat
      • Editeur : Springer International Publishing Ag
      • Langue : Anglais
      • Parution : 01/11/2018
      • Format : Moyen, de 350g à 1kg
      • Nombre de pages : 340.0
      • ISBN : 9783030016463



      • Biographie:
        He is author of book Digital Switching Systems -System Reliability Analysis published by McGraw-Hill, 1997, ISBN 0-07-001069-2. Syed is an expert in the field with extensive experience in analyzing reliability of advanced network architectures around the world. ...

        Sommaire:
        Syed R. Ali, DEE, is currently CEO and Principal of Software Reliability Research, LLC conducting upfront research and consultation with sophisticated software tools and methodologies for companies and organizations that seek state-of-the-art reliability analysis of their products and services for Next Generation Networks (NGN), Virtualized Networks, emerging wireless and other technologies. The objective of his organization is to provide high reliability framework for assessing and measuring overall operational end-to-end reliability of complex real-time mission critical systems. Syed was principal consultant at Bell Communications Research for over 30 years and was instrumental in setting up industry wide metrics was measuring software quality at all life cycle phases. He pioneered the concept of software fault insertion techniques for increasing software reliability before its released. While at Telcordia (formerly Bellcore) he developed Telcordia's In-Process Quality Metrics (IPQM,GR-1315), Object Oriented Process Metrics (OOPM, SR-4047), and contributed to many IEEE and ISO standards. He is author of book Digital Switching Systems -System Reliability Analysis published by McGraw-Hill, 1997, ISBN 0-07-001069-2. Syed is an expert in the field with extensive experience in analyzing reliability of advanced network architectures around the world. He has consulted with Ericcson (Sweden), Nortel (Canada), Siemens (Germany), NEC (Japan), Alcatel, (France), Singtel (Singapore), and Fujitsu (Japan) and has supported many international standard bodies. Syed is the past chairperson of IEEE Communications and co-founder of Computer Society New York Section. He is a frequent speaker at many IEEE and international telecommunications forums and is regarded as a leader in the field of reliability. Syed received his BSEE from Bangladesh University of Engineering & Technology (BUET), MSEE from Tuskegee University, Tuskegee Alabama and DEE from New JerseyInstitute of Technology, Newark, NJ....

        Détails de conformité du produit

        Consulter les détails de conformité de ce produit (

        Personne responsable dans l'UE

        )
        Le choixNeuf et occasion
        Minimum5% remboursés
        La sécuritéSatisfait ou remboursé
        Le service clientsÀ votre écoute
        LinkedinFacebookTwitterInstagramYoutubePinterestTiktok
        visavisa
        mastercardmastercard
        klarnaklarna
        paypalpaypal
        floafloa
        americanexpressamericanexpress
        Rakuten Logo
        • Rakuten Kobo
        • Rakuten TV
        • Rakuten Viber
        • Rakuten Viki
        • Plus de services
        • À propos de Rakuten
        Rakuten.com